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Effect of high temperature reduction in hydrogen on Pt deposited on the TiO2(100) surface: An angle resolved x-ray photoemission study

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Abstract

The effect of high temperature reduction in hydrogen was studied by angle resolved XPS in a system formed of platinum deposited on the (100) surface of a TiO2 single crystal sample. The analysis of the variation of the Pt/Ti XPS signal ratio as a function of the electron collection angle showed that partially reduced titanium oxide is present on the Pt film after the reduction treatment. The amount of oxide on the Pt surface is of the order of one monolayer equivalent.

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Author notes

  1. K. Tamura

    Present address: Japan Institute for Atomic research, 1233 Watanuki, 370-12, Takasaki, Japan

Authors and Affiliations

  1. Dipartimento di Chimica, Università di Firenze, 50121, Firenze, Italy

    U. Bardi

  2. Institute of Industrial Science, University of Tokyo, 22-1 Roppongi 7 chome, 106, Tokyo, Japan

    K. Tamura & Y. Nihei

Authors
  1. U. Bardi
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  2. K. Tamura
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  3. Y. Nihei
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Bardi, U., Tamura, K. & Nihei, Y. Effect of high temperature reduction in hydrogen on Pt deposited on the TiO2(100) surface: An angle resolved x-ray photoemission study. Catal Lett 3, 117–128 (1989). https://doi.org/10.1007/BF00763722

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  • DOI: https://doi.org/10.1007/BF00763722

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