Oxidation kinetics of a Pb-64 at.% in single-phase alloy

Abstract

The solid-state oxidation kinetics of a Pb-64 at. % In (50 wt. %) single-phase alloy were studied from room temperature to 150°C using an AES (Auger Electron Spectroscopy) depth profiling technique. The general oxidation behavior of this alloy is different from that of a Pb-3 at.% In alloy but similar to that of a Pb-30 at.% In alloy. The oxide formed on this alloy is almost pure In oxide (In₂O₃) with the possible existence of some In suboxide near the oxide/alloy interface. At room temperature, oxidation of the alloy follows a direct logarithmic law, and the results can be described by the model proposed previously by Zhang, Chang, and Marcotte. At temperatures higher than 75° C, rapid oxidation occurred initially followed by a slower parabolic oxidation at longer time. These data were described quantitatively by the model which assumes the existence of short-circuit diffusion in addition to lattice diffusion in the oxide as proposed by Smeltzer, Haering, and Kirkaldy. The effects of alloy composition on the oxidation kinetics of (Pb, In) alloy are also examined by comparing the data for Pb-3, 30, and 64 at. % In alloys.