Abstract
The areal density and the depth distribution of3He trapped in Ni as a function of the bombarding fiuence was measured in the energy range of 1–25 keV and at angles of incidence between 0 and 85° using nuclear reaction analysis. At fluences below saturation a linear relation is found between the areal density and the fiuence. From its slope the trapping and reflection coefficients can be determined.
The experimental data for trapping and reflection coefficients and for the depth profiles were compared with computer simulation results from the TRIM program. To reduce uncertainties in the absolute values of the experimental trapping coefficients, they were normalized to the TRIM values at normal incidence. The dependence of the measured reflection coefficient on the angle of incidence between 0 and 80° shows good agreement with the calculated data for incident energies from 3 to 25 keV, but for 1 keV the measured reflection coefficients are higher than the calculated ones.
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References
E.S. Mashkova, V. A. Molchanov:Scattering of Medium Energy Ions by Solid Surface (Atomizdat, Moscow 1980)
E.S. Mashkova: Radiat. Eff.54, 1 (1981)
W. Eckstein, H. Verbeek: J. Nucl. Mat.97, 319 (1981)
O.R. Oen, M. T. Robinson: Nucl. Instrum. Methods132, 647 (1976)
W. Eckstein, H. Verbeek: J. Nucl. Mat.93&94, 518 (1980)
J. Bøttiger: J. Nucl. Mat.78, 161 (1978)
J.P. Biersack, L.G. Haggmark: Nucl. Instrum. Methods174, 257 (1980)
R. Behrisch, J. Bøttiger, W. Eckstein, J. Roth, B.M.U. Scherzer: J. Nucl. Mat.56, 365 (1975)
R.S. Blewer, R. Behrisch, B.M.U. Scherzer, R. Schulz: J. Nucl. Mat.76&77, 325 (1978)
B.M.U. Scherzer, H.L. Bay, R. Behrisch, P. Børgesen, J. Roth: Nucl. Instrum. Methods157, 75 (1978)
W. Eckstein, J.P. Biersack: To be published
J.F. Ziegler:Stopping Power and Ranges in all Elements, Vol.4 (Pergamon Press, New York 1977)
J. Ehrenberg, R. Behrisch, B.M.U. Scherzer: Nucl. Instrum. Methods194, 501 (1982)
G. Staudenmaier, J. Roth, R. Behrisch, J. Bohdansky, W. Eckstein, P. Staib, O. Matteson: J. Nucl. Mat.84, 149 (1979)
J. Bohdansky, J. Roth, M.K. Sinha, W. Ottenberger: J. Nucl. Mat.63, 115 (1976)
W. Eckstein, H. Verbeek: Max-Planck-Institut für Plasmaphysik, Garching, Report IPP 9/32 (1979)
J.E. Robinson, D.P. Jackson: J. Nucl. Mat.76&77, 353 (1978)
D.P. Jackson, W. Eckstein: Nucl. Instrum. Methods194, 671 (1982)
J. Bohdansky, G.L. Chen, W. Eckstein, J. Roth: J. Nucl. Mat.103&104, 339 (1981)
R. Schulz, R. Behrisch, B.M.U. Scherzer: J. Nucl. Mat.93&94, 608 (1980)
W. Eckstein: Unpublished work
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Chen, C.K., Eckstein, W. & Scherzer, B.M.U. Trapping and reflection coefficients for3He in Ni at oblique incidence. Appl. Phys. A 31, 37–44 (1983). https://doi.org/10.1007/BF00617186
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DOI: https://doi.org/10.1007/BF00617186