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A novel technique for measuring resistance fluctuations independently of background noise

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Abstract

A novel method is presented for measuring the spectral density of resistance fluctuations without the explicit determination of the voltage background noise (Johnson noise, pre-amplifier noise). The output of a standard ac bridge excited by a single-frequency alternating current is demodulated by two phase-sensitive detectors which operate in quadrature. When the phase difference between excitation and detection is properly set, the real part of the cross-spectral density of the two demodulators shows only the spectral density of the resistance fluctuations and not the disturbing background noise. The feasibility of our new method is demonstrated by measurements of 1/f noise of a thin-film A1 sample.

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References

  1. P. Dutta, P.M. Horn: Rev. Mod. Phys.53, 497–516 (1981)

    Google Scholar 

  2. J.W. Eberhard, P.M. Horn: Phys. Rev. B18, 6681–6693 (1978)

    Google Scholar 

  3. R.D. Black, P.J. Restle, M.B. Weissman: Phys. Rev. Lett.51, 1476–1479 (1983)

    Google Scholar 

  4. D.M. Fleetwood, N. Giordano: Phys. Rev. B31, 1157–1160 (1985)

    Google Scholar 

  5. J.H. Scofield, J.V. Mantese, W.W. Webb: Phys. Rev. B32, 736–742 (1985)

    Google Scholar 

  6. R.H. Koch, J.R. Lloyd, J. Cronin: Phys. Rev. Lett.55, 2487–2490 (1985)

    Google Scholar 

  7. J. Pelz, J. Clarke: Phys. Rev. Lett.55, 738–741 (1985)

    Google Scholar 

  8. R.D. Black, W.M. Snow, M.B. Weissman: Phys. Rev. B25, 2955–2958 (1982)

    Google Scholar 

  9. M.B. Weissman: Ph.D. thesis, University of California, San Diego (1976)

    Google Scholar 

  10. H. Stoll: Appl. Phys.22, 185–187 (1980)

    Google Scholar 

  11. J.R. Lloyd, R.H. Koch: Bull. Am. Phys. Soc.31, 527 (1986)

    Google Scholar 

  12. J.H. Scofield: Rev. Sci. Instrum.58, 985–993 (1987)

    Google Scholar 

  13. This circuit is available in integrated form (Analog Devices AD 630)

  14. C. Gabrielli, F. Huet, M. Keddam, L. Raillon: Huitième Colloque sur le Traitement du Signal et ses Applications, Nice, 201–207 (1981)

  15. F.N. Hooge: Phys. Lett.29A, 139–140 (1969)

    Google Scholar 

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Author notes

  1. A. H. Verbruggen

    Present address: Centrum voor Submicrontechnologie, Faculteit der Technische Natuurkunde, Technische Universiteit Delft, NL-2628CJ, Delft, The Netherlands

Authors and Affiliations

  1. Institut für Physik, Max-Planck-Institut für Metallforschung, Postfach 800605, D-7000, Stuttgart 80, Germany

    A. H. Verbruggen & H. Stoll

  2. Natuurkundig Laboratorium der Vrije Universiteit, NL-1081HV, Amsterdam, The Netherlands

    K. Heeck

  3. IBM Thomas J. Watson Research Center, P.O. Box 218, 10598, Yorktown Heights, NY, USA

    R. H. Koch

Authors
  1. A. H. Verbruggen
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  2. H. Stoll
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  3. K. Heeck
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  4. R. H. Koch
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Verbruggen, A.H., Stoll, H., Heeck, K. et al. A novel technique for measuring resistance fluctuations independently of background noise. Appl. Phys. A 48, 233–236 (1989). https://doi.org/10.1007/BF00619390

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  • DOI: https://doi.org/10.1007/BF00619390

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