Abstract
Optical properties in the spectral range from 0.06 to 5.5 eV of fullerite films on different substrates, C60 powder, and dissolved fullerene material are investigated by spectroscopic ellipsometry and optical transmission and reflection measurements. Depolarization effects are taken into account during determination of the dielectric function of fullerite films by ellipsometry. The optical gap for C60 films is found to be 1.63 eV. Three optical absorption bands are observed at 2.69, 3.53, and 4.49 eV.
The dielectric function in the infrared shows the four characteristic infrared vibrational modes. The interference pattern seen in UV/VIS reflection measurements are used for high-precision thickness determination of the films. The Clausius-Mossotti formula is successfully applied to reproduce the experimental optical data measured in C60/dichlormethane solutions. Deviations between theory and experiments provide interesting information about the intermolecular interaction of the C60 molecules. A tentative interpretation of the measured absorption bands is presented.
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H.W. Kroto, J.R. Heath, S.C. O'Brien, R.F. Curl, R.E. Smalley: Nature318, 162 (1985)
H. Ajie, M.M. Alvarez, S.J. Anz, R.D. Beck, F. Diederich, K. Fostiropoulos, W. Krätschmer, Y. Rubin, K.E. Shriver, D. Sensharma, R.L. Whetten: J. Phys. Chem.94, 8630 (1990)
J.P. Hare, H.W. Kroto, R. Taylor: Chem. Phys. Lett.177, 394 (1991)
A.F. Hebard, R.C. Haddon, R.M. Fleming, A.R. Kortan: Appl. Phys. Lett.59, 2109 (1991)
S.L. Ren, Y. Wang, A.M. Rao, E. McRae, J.M. Holden, T. Hager, K.A. Wang, W.T. Lee, H.F. Ni, J. Selegue, P.C. Eklund: Appl. Phys. Lett.59, 2678 (1991)
A. Skumanich: Chem. Phys. Lett.182, 486 (1991)
G. Gensterblum, J.J. Pireaux, P.A. Thiry, R. Caudano, J.P. Vigneron, Ph. Lambin, A.A. Lucas, W. Krätschmer: Phys. Rev. Lett.67, 2171 (1991)
P.N. Saeta, B.I. Greene, A.R. Kortan, N. Kopylov, F.A. Thiel: Chem. Phys. Lett.190, 184 (1992)
E. Sohmen, J. Fink, W. Krätschmer: Z. Phys. B86, 87 (1992)
E. Sohmen, J. Fink, W. Krätschmer: Europhys. Lett.17, 51 (1992)
M.K. Kelly, P. Etchegoin, D. Fuchs, W. Krätschmer, K. Fostiropoulos: Phys. Rev. B46, 4963 (1992)
P. Milani, M. Manfredi, G. Guizzetti, F. Marabelli, M. Patrini: Solid State Commun.90, 639 (1994)
S. Saito, A. Oshiyama: Phys. Rev. Lett.66, 2637 (1991)
W.Y. Ching, M.Z. Huang, Y.N. Xu, W.G. Harter, F.T. Chan: Phys. Rev. Lett.67, 2045 (1991)
E.L. Shirley, S.G. Louie: Phys. Rev. Lett.71, 133 (1993)
F.W. Smith: J. Appl. Phys.55, 764 (1994)
A. Richter, H.-J. Scheibe, W. Pompe, K.-W. Brzezinka, I. Mühling: J. Non-Cryst. Solids88, 131 (1986)
N. Savvides: J. Appl. Phys.59, 4133 (1986)
A. Richter, K.-W. Brzezinka, P. Reich, J. Erxmeyer, B. Mertesacker, H.-J. Scheibe, D. Drescher: Phys. Rev. B (1994) (submitted)
A. Richter, B. Winzer, G. Keßler, J. Erxmeyer, B. Mertesacker, A. Weidinger, K.-W. Brzezinka:Int'l Conf. Charge Transfer at Fullerenes, Bad Schandau, Germany (1993)
R.M.A. Azzam, N.M. Bashara:Ellipsometry and Polarized Light (North-Holland, Amsterdam 1977)
M. Born, E. Wolf:Principles of Optics (Pergamon Oxford 1980)
A. Röseler:Infrared Spectroscopy Ellipsometry (Akademie, Berlin 1990)
F. Wooten:Optical Properties of Solids (Academic, New York 1972)
J.-Th. Zettler, Th. Trepk, L. Spanos, Y.-Z. Hu, W. Richter: Private communication
J. Sturm:Int'l Conf. Charge Transfer at Fullerenes, Bad Schandau, Germany (1993)
K.-A. Wang, A.M. Rao, P.C. Eklund, M.S. Dresselhaus, G. Dresselhaus: Phys. Rev. B48, 11375 (1994)
J. Brunn, B. Harbecke: Private communication
D.E. Aspnes, A.A. Studona: Phys. Rev. B27, 985 (1983)
T. Rabenau, A. Simon, R.K. Kremer, E. Sohemen: Z. Phys. B50, 69 (1993)
B. Heinz: Optische Konstanten von Halbleiter-Mehrschichtsystemen. Dissertation, RWTH Aachen (1991)
S. Adachi: J. Appl. Phys.66, 3224 (1989)
D. Fink, R. Klett, J. Sturm: Unpublished
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Richter, A., Sturm, J. Dielectric and optical properties of C60 material studied by ellipsometry and quantitative IR and UV/VIS spectroscopy. Appl. Phys. A 61, 163–170 (1995). https://doi.org/10.1007/BF01538384
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DOI: https://doi.org/10.1007/BF01538384