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Qualitative relationships describing height and phase images of tapping mode atomic force microscopy. An application to micro-contact-printed patterned self-assembled monolayers

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Authors and Affiliations

  1. Department of Chemistry, North Carolina State University, Raleigh, North Carolina 27695-8204, USA, , , , , , US

    M.H. Whangbo

  2. Freiburger Materialforschungszentrum, Stefan-Meier-Str. 21, D-79104 Freiburg, Germany, , , , , , DE

    G. Bar & R. Brandsch

Authors
  1. M.H. Whangbo
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  2. G. Bar
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  3. R. Brandsch
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Received: 25 July 1997/1 October 1997

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Whangbo, M., Bar, G. & Brandsch, R. Qualitative relationships describing height and phase images of tapping mode atomic force microscopy. An application to micro-contact-printed patterned self-assembled monolayers . Appl Phys A 66 (Suppl 1), 1267–1270 (1998). https://doi.org/10.1007/s003390051340

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  • DOI: https://doi.org/10.1007/s003390051340

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