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Received: 25 July 1997/Accepted: 1 October 1997
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Bouju, X., Devel, M. & Girard, C. Electric field effect and atomic manipulation process with the probe tip of a scanning tunneling microscope . Appl Phys A 66 (Suppl 1), S749–S752 (1998). https://doi.org/10.1007/s003390051235
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DOI: https://doi.org/10.1007/s003390051235