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Modeling for thermal conductivity measurements of thin films using photothermal deflection with obliquely crossed configuration

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Authors and Affiliations

  1. Institute of Acoustics and Laboratory of Modern Acoustics, Nanjing University, Nanjing 210093, P R China (Fax: 86-25-3605557, E-mail: pasla@nju.edu.cn), , , , , , CN

    B.-C. Li & S.-Y. Zhang

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  1. B.-C. Li
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  2. S.-Y. Zhang
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Received: 21 December 1996

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Li, BC., Zhang, SY. Modeling for thermal conductivity measurements of thin films using photothermal deflection with obliquely crossed configuration . Appl Phys B 65, 403–409 (1997). https://doi.org/10.1007/s003400050288

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  • DOI: https://doi.org/10.1007/s003400050288

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