Skip to main content
SpringerLink
Log in

High-precision index measurement in anisotropic crystals using white-light spectral interferometry

  • Regular paper
  • Published:
Applied Physics B Aims and scope Submit manuscript

Abstract.

White-light spectral interferometry appears an excellent tool for precise determination of indices, and has already been successfully applied to different isotropic or weakly dispersive materials such as glass or rhodamine films. In this paper, we extend the spectral method to the measurement of anisotropic media with strong dispersion. The method is discussed below and allows an accuracy of the order of 10-5 on the principal indices of a birefringent silver thiogallate (AgGaS2) crystal.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

Author information

Authors and Affiliations

  1. Laboratoire de Physico-Chimie de l’Atmosphère, Université du Littoral, M.R.E.I.D. 145, route du Pertuis d’Amont, 59140 Dunkerque, France (Fax: +33-03/2865-8244, E-mail: delb@hplamer.univ-littoral.fr), , , , , , FR

    H. Delbarre, C. Przygodzki, M. Tassou & D. Boucher

Authors
  1. H. Delbarre
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. C. Przygodzki
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. M. Tassou
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. D. Boucher
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Received: 10 September 1998 / Revised version: 11 May 1999 / Published online: 30 November 1999

Rights and permissions

Reprints and permissions

About this article

Cite this article

Delbarre, H., Przygodzki, C., Tassou, M. et al. High-precision index measurement in anisotropic crystals using white-light spectral interferometry . Appl Phys B 70, 45–51 (2000). https://doi.org/10.1007/s003400050006

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/s003400050006

Search

Navigation