Profile analysis of diffractometer data

A computer program has been written for the evaluation of integrated intensities from X-ray diffractometer data. It has been compiled for IBM 360/65 and HP 2100A. The Lehmann-Larsen profile-analysis method [Lehmann & Larsen (1974). Acta Cryst. A30, 580-584] has been used. For weak reflections, profiles obtained from well defined, neighbouring reflections are employed.