Inelastic collisions of kV electrons in solids
References (65)
- et al.
Phys. Rev.
(1977) Rev. Mod. Phys.
(1971)- et al.
J. Phys. D (Appl. Phys.)
(1984) - et al.
Surface Interface Anal.
(1988) Phys. Rev.
(1970)- et al.
Solid State Phys.
(1961) - et al.
Phys. Scripta
(1972) - et al.
J. Appl. Phys.
(1968) - et al.
Solid State Commun.
(1970) - et al.
J. Chem. Soc. Faraday Trans. II
(1970)
J. Phys. F (Metal Phys.)
(1973)
Surface Sci.
(1971)
Phys. Rev.
(1968)
Phys. Rev.
(1972)
Chem. Phys. Letters
(1976)
J. Vacuum Sci. Technol.
(1975)
J. Electron Spectrosc. Related Phenomena
(1988)
Elementary Excitations in Solids
(1964)
J. Opt. Soc. Am.
(1975)
Phys. Rev.
(1962)
Surface Sci.
(1979)
Excitation of Plasmons and Interband Transitions by Electrons
(1980)
Advan. Phys.
(1982)
J. Phys. F (Metal Phys.)
(1988)
Phil. Mag.
(1977)
Phys. Rev.
(1987)
Surface Sci.
(1979)
Phys. Kondens. Mater.
(1967)
Surface Interface Anal.
(1988)
Cited by (145)
Monte Carlo simulation study on secondary electron yield of SiO<inf>2</inf>
2024, Results in PhysicsDetermination of electron inelastic mean free path and stopping power of hafnium dioxide
2023, Results in PhysicsDetermination of electron backscattering coefficient of beryllium by a high-precision Monte Carlo simulation
2021, Nuclear Materials and EnergyEnergy loss of charged particles in collision with atoms and surfaces
2019, Advances in Quantum ChemistryCitation Excerpt :For the investigation of the surface and bulk contribution we present Monte Carlo simulation of the reflected electron energy loss spectroscopy (REELS) spectra of silver. The simulation is based on the application of the dielectric function formalism,18,21–23 where both the individual elastic and the inelastic scattering events in the solid were taken into account. In the present Monte Carlo simulations the simple form of the surface as well as the bulk energy loss functions were applied.
- ∗
On leave from: Fundamental Physics Center, China University of Science and Technology, Hefei, Anhui, People's Rep. of China.
Copyright © 1989 Published by Elsevier B.V.