Intensity distribution monitors for secondary particle beams

https://doi.org/10.1016/0029-554X(80)90500-5Get rights and content

Abstract

Scanning devices have been developed for measuring the intensity distribution of secondary particle beams. The monitors are used for rapid beam optimization in the SIN scattered proton beam.

References (2)

  • L. Rezzonico

    SIN-Report TM-09-26

    (1972)
  • M. Daum

    SIN-Report TM-09-45

    (1976)

Cited by (1)

View full text