Positive identification of XeH molecular ion

https://doi.org/10.1016/0168-583X(90)90449-5Get rights and content

Abstract

We describe in the present work the observation of XeH molecular ions from a standard Hiconex 834 source in which a sputter target of AgI mixed with Ag was sprayed with Xe gas. The formation of XeH ions is positively demonstrated by identifying 129Xe and 131Xe by AMS analysis and energy and time-of-flight measurements, when negative ions of mass 130 and 132, respectively, are injected into the 14UD Rehovot Pelletron tandem accelerator. No evidence for the formation of Xe ions was found. The dependence of the intensity of the xenon group on the xenon gas pressure in the ion source shows that the probability of formation of XeH is very low and should not pose a significant background problem under normal circumstances in AMS measurements of 129I.

References (6)

  • E. Boaretto et al.

    Nucl. Instr. and Meth.

    (1990)
  • M. Paul et al.

    Nucl. Instr. and Meth.

    (1987)
  • M.A. Garwan et al.
There are more references available in the full text version of this article.

Cited by (0)

View full text