Yield of Lα X-rays from a light element matrix in thick-target PIXE

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Abstract

Yields of Lα X-rays from a light element matrix have been measured for elements with atomic number 52 ≤ Z ≤ 92, for incident proton energy of 2.61 MeV. The experimental results have been compared with the results of numerical calculations using L X-ray production cross section data in literature. It is shown that results of such calculations can be used for analytical application using monostandards in thick-target PIXE.

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Cited by (2)

Present address: Department of Physics, National Defence Academy, Yokosuka, Kanagawa, Japan.

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Present address: Physics Department, King Fahad University of Petroleum and Minerals, Dahran, Saudi Arabia.

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