Heavy-ion energy resolution of SSB detectors

doi:10.1016/0168-583X(90)90834-H

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Volume 45, Issues 1–4, 2 January 1990, Pages 275-280

https://doi.org/10.1016/0168-583X(90)90834-H Get rights and content

Abstract

The energy resolution of the silicon surface barrier detectors currently used for ERD (elastic recoil detection) and HIRBS (heavy-ion Rutherford backscattering spectroscopy) limits both the mass and depth resolution achieveable. Although the timing properties and pulse height defect of SSBDs have been well documented, only limited studies of their heavy-ion energy resolution in the energy range 5–20 MeV were available. Data on the energy resolution and line shape of two Ortec BA-017-100-100 detectors are presented and compared with a survey of SSB detector resolution data available in the literature.

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Energy resolution measurement and application of the F series ORTEC SSB detector in TOF-ERDA spectrometry
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Measured noise level (using precision pulser), in the case of 7Li ions, was 18.6 keV (FWHM), which is in good agreement with a value given by producer. Thus, it can be concluded that F series ORTEC SSB detector is, concerning the energy resolution for the light ions, worse than GIC and A series SSB detector [11]. In case of 16O (Fig. 2), energy resolution for ORTEC F series detector is slightly better than one set of the GIC results published in Ref. [6] but is worse than another GIC data set [7].
In the Elastic Recoil Detection Analysis (ERDA) and Heavy Ion Rutherford Backscattering Spectrometry (HIRBS), silicon surface barrier (SSB) detectors as well as other types of Si charged particle detectors are conventionally used for measuring ion energy due to their simplicity and ease of use. Energy resolution of such detectors is a limiting factor for both, mass and depth resolution in the experiment. In the present work we have studied performance of the commercially available F series ORTEC SSB detector designed in particular for heavy ion spectroscopy (BF-023-300-60). Detector energy and mass resolution were measured for a wide range of ion masses (⁷Li, ¹⁶O, ²⁸Si, ³⁵Cl and ⁸¹Br) and energies (2–20 MeV). Obtained results were compared with the already published data for a standard A series ORTEC SSB detector (BA-017-100-100) and gas ionization chambers. Possible application of the F series SSB detector in time-of-flight ERDA (TOF-ERDA) spectrometer was discussed.
Performance of the ETH gas ionization chamber at low energy
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As pointed out in [24], there must be non-ionizing energy loss processes not included in SRIM or systematic Z dependent electrical screening in the ion track reducing the net charge collection. In order to compare the performance of the GIC with solid state detectors, the resolution for boron and chlorine obtained with the GIC are shown in Fig. 11a and b together with the values obtained by Hinrichsen et al. [27] with a silicon surface barrier detector (SSD). A similar comparison was already made in [5] for the energy resolution of an annular gas ionization detector with 7Li, 16O and 35Cl ions at energies larger than 1 MeV.
The performance of gas ionization chambers (GIC) for the detection of low energy ions has been considerably improved in the past years by the use of silicon nitride entrance windows and low noise preamplifiers. This has led to an increased use of high resolution GICs in the fields of accelerator mass spectrometry and ion beam analysis. This development and the underlying physical principles are reviewed and the latest technical status of such devices is summarized.
A detailed study on energy resolution and pulse height defect is presented with projectiles covering a wide particle mass range (H, ⁹Be, ¹³C, ²⁷Al, ³⁵Cl, ¹²⁷I, ²³²Th) with energies between 0.1 and 2.2 MeV. The dependence of energy resolution and charge output per unit particle energy on the nuclear charge of the projectile is investigated and parametrized. SRIM calculations of ionizing energy loss considerably differ from these experimental findings. For 1 MeV particles discrepancies up to 50% are observed.
The performance of GICs and their practical use is compared to that of solid state detectors. The potential for further improvement of the technology and its fields of application are assessed.
The possibility of using a single surface barrier detector as a Δe-E telescope for identification of light charged particles (Z=1, 2) and fragments with Z<=4
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In this work it has been shown theoretically that a single fully depleted n-type silicon surface barrier detector may be used as a ΔE-E telescope for identification of charged particles of very low-Z. A thin slice of the detector at the positive end is assumed as the ΔE detector and the rest part up to the negative end as the E detector. A mathematical formulation for the energy lost by an incident charged particle in the ΔE part of the detector is made. A comparison is made between the telescopes converted from n-type and p-type detectors. The procedure to evaluate a detector suitable for a required telescope is described. The basic technique of a module named ‘preset pulse clipper’, which may be required in connection with the estimation of the energy lost in the ΔE part, is proposed. The possibility of reproducing the basic principle of the ‘preset pulse clipper’ by means of digital sampling and software based processing techniques is explored. The possible superiorities of this type telescope over the traditional ‘two detector ΔE-E telescope’ are discussed.
Annular gas ionization detector for low energy heavy ion backscattering spectrometry
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A gas ionization chamber for use in backscattering spectrometry has been built. It has the shape of a hollow cylinder and can be placed in-line with the incident ion beam. The entrance window for detected particles is composed of a circular array of silicon nitride membranes. A low noise preamplifier with cooled FET is used for charge amplification. The detector resolution has been measured for a variety of ions in the mass range from He to Si and for energies between 0.5 and 8 MeV. The energy resolution of the ionization chamber surpasses the one of a state-of-the-art silicon charged particle detector for all ions heavier than Li. For Si ions the improvement in resolution is more than a factor of 2. The device does not suffer from any radiation damage. For He particles around 1 MeV the resolution is between 13 and 16 keV (FWHM). Therefore the new detector is not only well suited for heavy ion backscattering spectrometry but can also be applied for standard He RBS, allowing the use of a single detector for all types of projectiles in a wide energy range.
Development of a time-of-flight spectrometer at the Ruder Bošković Institute in Zagreb
2008, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Citation Excerpt :
Time-of-flight (TOF) elastic recoil detection analysis (ERDA) is a simple method for the mass separation and depth profiling of the light elements. The energy resolution of the silicon surface barrier detectors (SSB) [1,2], used in classical ERDA setup, limits depth resolution for the heavier ions (Z > 3) (pulse height defects). In the TOF-ERDA setup, energy of the recoiled particles is calculated from the time-of-flight between the two time detectors.
A new TOF telescope has been constructed for thin film and surface analysis. The timing system consists of two electrostatic mirror type detectors of Busch design. The detection efficiency of timing stations for very light ions was significantly improved using DLC (diamond like carbon) foils coated with LiF instead of the conventionally used carbon foils. Ion energy is measured by a 300 mm² ULTRA ion-implanted silicon detector. For the ERDA measurements with heavy and energetic ion beams, a time-of-flight (TOF) spectrometer is positioned at 37.5°. Spectrometer can be easily moved to 120° backward angle for time-of-flight RBS analysis with low energy beam of light ions. Positioning and fine adjustments of sample orientation are performed with a motorized sample stage. The same spectrometer can be also installed at the ion microprobe scattering chamber for 3D elemental imaging.
Investigations of SiO<inf>x</inf>-polymer "interphases" by glancing angle RBS with Li<sup>+</sup> and Be<sup>+</sup> ions
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In order to better understand the formation of an “interphase”, which is a known feature between SiO₂ coatings deposited by plasma enhanced chemical vapor deposition (PECVD) and polymeric substrates, we have deposited such layers on Kapton® polyimide (PI). Various deposition routes have been used, namely thermal evaporation (physical vapor deposition, PVD), and distributed electron cyclotron resonance (DECR) PECVD, with the substrate placed within the active glow zone and downstream from it. The actual presence and the width of the interphase were investigated using glancing angle Rutherford backscattering spectroscopy (RBS), with a scattering angle of 92°. To maximize the depth resolution, the RBS experiments have been performed using “heavy” (Li⁺ and Be⁺) ions.

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^∗: On leave from John Abbott College, St. Anne De Bellevue, Québec, H9X 3L9 Canada.

^∗∗: On leave from Vanier College, 821 Ste-Croix Blvd., St. Laurent, Québec, H4L 3X9 Canada.

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Heavy-ion energy resolution of SSB detectors

Abstract

Nucl. Instr. and Meth.

Nucl. Instr. and Meth.

Nucl. Instr. and Meth.

Thin Solid Films

Nucl. Instr. and Meth.

Nucl. Instr. and Meth.

Nucl. Instr. and Meth.

Nucl. Instr. and Meth.

Nucl. Instr. and Meth.

Nucl. Instr. and Meth.