The electron screening effect in muonic 28Si

doi:10.1016/0375-9474(84)90687-0

Nuclear Physics A

Volume 429, Issue 3, 12 November 1984, Pages 381-388

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Abstract

We have measured the wavelengths of the $4 f_{72} -3 d_{52}$ and the $4 f_{52} -3 d_{32}$ X-ray transitions in μ-²⁸Si with the bent-crystal spectrometer at the SIN muon channel. The results are compared to the calculated transition wavelengths which include radiative corrections (QED). The differences in the corresponding transition energies are attributed to the electron screening shift. Combining the results from both transitions, we obtain ΔE_ES(4f-3d) = −1.66±0.20 eV. This corresponds to (83±11)% of the electron-screening shift calculated for a neutral atom with the muon and Z − 1 electrons. These results are in moderate agreement with cascade calculations constrained to reproduce measured muonic X-ray intensities.

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^☆: This work is supported in part by SIN.

¹: Present address: SLAC, BIN 37, PO Box 4349, Stanford, CA 94305, USA.

²: Present address: LAMPF, Los Alamos, NM 87545, USA.

³: Present address: EP-Division, CERN, CH-1211 Genève 23, Switzerland.

⁴: Present address: Cal. Tech., Pasadena, CA 91125, USA.

⁵: Present address: Laboratory for Nuclear Science, MIT, Cambridge, Mass. 02139, USA.

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The electron screening effect in muonic 28Si☆

Abstract

Z. Phys.

Ann. of Phys.

Phys. Rev. Lett.

Phys. Rev.

The electron screening effect in muonic ²⁸Si☆