Elsevier

Annals of Physics

Volume 192, Issue 1, 15 May 1989, Pages 146-157
Annals of Physics

Statistical emission at high excitation energies

Dedicated to Herman Feshbach in honor of his 70th birthday
https://doi.org/10.1016/0003-4916(89)90123-1Get rights and content

Abstract

Two methods for calculating inclusive yields for processes consisting of chains of sequential emissions are discussed. Both are based on partial widths (emission rates) and related branching ratios. One of these, involving detailed simulations of the decay chains, is reformulated to facilitate approximations which are required at high energy where full simulations become impractical. An approximation is discussed and illustrated. The second method, based on time-integration of a specific decay rate, is shown to be closely related to the reformulated simulation method.

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