The measurement of position dependent trace element concentrations with micro-proton induced X-ray emission

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Abstract

The extension of the Proton Induced X-Ray Emission (PIXE) technique to micro-PIXE is described here. This development involves the possibility of measuring trace element distributions on the ppm level with spatial resolution on the μm scale. The possible applications of the proton microprobe at our institute are described on the basis of measurements of element distributions across the diameter of human scalp hair.

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1

Permanent address: Institute “Ruder Bosković”, Zagreb, Yugoslavia.

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