Abstract
A reduced physical model of the integral non-linearity error in high resolution R-2R D/A converters is obtained by circuit analysis and application of the ambiguity algorithm. Its relationships with the well establisheda priori model based on Rademacher functions is discussed. Experiments, carried out on a sample of commercial 12 bit converters, demonstrate that functional test programs based on this model achieve shorter test times and lower prediction errors than those based on larger models obtained by straight QR factorization.
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References
T.M. Souders and G.N. Stenbakken, “A comprehensive approach for modeling and testing analog and mixed-signal devices,”Proc. of International Test Conference, 1990, pp. 169–176.
T.M. Souders and G.N. Stenbakken, “Linear error modeling of analog and mixed-signal devices,”Proc. of International Test Conference, 1991, pp. 573–581.
G.N. Stenbakken and T.M. Souders, “Test-Point selection and testability measures via QR factorization of linear models,”IEEE Trans. on Instrumentation and Measurement, Vol. IM-36(2), pp. 406–410, June 1987.
G.N. Stenbakken, T.M. Souders, and G.W. Stewart, “Ambiguity groups and testability,”IEEE Trans. on Instrumentation and Measurement, Vol. IM-38(5), October 1989.
K.G. Beauchamp, “Applications of Walsh and related functions,” Academic Press, 1984.
Analog Devices, “Data coverter reference manual,” Vol. 1, October 1991.
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Boni, A., Chiorboli, G., Franco, G. et al. Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm. J Electron Test 7, 145–155 (1995). https://doi.org/10.1007/BF00995310
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DOI: https://doi.org/10.1007/BF00995310