Abstract
Intensity distribution in a diffraction pattern of the electron diffraction at a filament depends to a great extent on its diameter. This is used for the determination of the filament diameter with an accuracy better than 2%. The described method is suitable e.g. for the determination of the local filament diameter in an electron biprism. Therefore the non-uniform diameter of filaments used in an electron biprism presents no difficulties in the interpretation of diffraction and interference patterns.
Similar content being viewed by others
References
Drahoš V., Delong A.: Čs. čas. fys.A 13 (1963), 278.
Komrska J., Drahoš V., Delong A.: Optica Acta 11 (1964), 145.
Komrska J., Drahoš V., Delong A.: Electron Microscopy (1964). Proc. Third Europ. Reg. Conf., Vol. A, Prague, NČSAV (1964), 1.
Author information
Authors and Affiliations
Additional information
The authors present their thanks to Dr. M. Černohorský CSc. from the Institute of Metallurgy for his helpful comments and to Dr. Ing. O. Hlínka from the Technical University, Brno, for his suggestion concerning the design of the plot in Fig. 2. They also thank Mrs V. Gregorová for her help with numerical calculations and drawing the diagrams.
Rights and permissions
About this article
Cite this article
Komrska, J., Drahoš, V. & Delong, A. The application of Fresnel fringes to the determination of the local filament diameter in an electron biprism. Czech J Phys 14, 753–756 (1964). https://doi.org/10.1007/BF01688899
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF01688899