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Quantitative phase analysis of Si3N4 by X-ray diffraction

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Journal of Materials Science Letters

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References

  1. C. P. GAZZARA and D. R. MESSIER,Bull. Amer. Ceram. Soc. 56 (1977) 777.

    Google Scholar 

  2. C. P. GAZZARA, in “Advances in X-ray analysis” (Kendall/Hunt, Dubuque, Iowa, 1976) p. 735.

    Google Scholar 

  3. H. P. KLUG and L. E. ALEXANDER, in “X-ray diffraction procedures for polycrystalline and amorphous materials”, 2nd Edn (Wiley, New York, 1974) p. 398.

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  4. B. D. CULLITY, in “Elements of X-ray diffraction”, 2nd Edn (Addison-Wesley, Menlo Park, California, 1978) p. 225.

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Authors and Affiliations

  1. Department of Chemical Engineering, University of Notre Dame, 46556, Notre Dame, IN, USA

    R. G. Pigeon & A. Varma

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  1. R. G. Pigeon
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  2. A. Varma
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Pigeon, R.G., Varma, A. Quantitative phase analysis of Si3N4 by X-ray diffraction. J Mater Sci Lett 11, 1370–1372 (1992). https://doi.org/10.1007/BF00729365

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  • DOI: https://doi.org/10.1007/BF00729365

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