Abstract
Ubiquitous elements like carbon and oxygen always contaminate surfaces and, therefore, are the soucre of important analytical errors at trace level. Even in the case of radioactivation (with charged particles), where the sample can be etched after irradiation, analytical problems exist. In this work, we show that laser desorption/ablation can efficiently clean surfacaes, in the case of GaAs samples, resulting in better analytical conditions. Under ultra high vacuum, these surfaces remain clean long enough, so that the analysis of carbon and oxygen can be carried out using various nuclear methods, according to the needs of the analyst.
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References
L. C. FELDMAN, J. W. MAYER, S. T. PICRAUX, Materials analysis by ion channeling, Academic Press, 1982.
J. W. MAYER, E. RIMINI (Eds), Ion Beam Handbook for Material Analysis, Academic Press, 1977, Chapter 4, Selected low energy nuclear reaction data.
J. N. BARRANDON, et al., C. R. Acad. Sc. Paris, 267 (1968) 1306.
M. A. MISDAQ et al., Report NIM BIS, 1986, P. 328.
E. HANNA BAKRAJI et al., Report NIM B 56/57, 1991, p. 896.
L. QUAGLIA et al., Report NIM 68, 1969, p. 315.
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Gomez, J., Blondiaux, G., Hakim, B. et al. Laser desorption/ablation combined with nuclear analytical methods for materials characterization. Journal of Radioanalytical and Nuclear Chemistry, Articles 160, 153–157 (1992). https://doi.org/10.1007/BF02041665
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DOI: https://doi.org/10.1007/BF02041665