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Microwave characterization of YBa2Cu3O7−x thin films grownin situ by Off-axis magnetron sputtering

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Il Nuovo Cimento D

Summary

Superconducting films of YBa2Cu3O7−x were depositedin situ on LaAlO3 substrates using single-target 90° off-axis sputtering. The obtained films have tipicalT c values of 91K. Surface resistance measurements on as-grown films reach 1.1 mΩ at 77K and 10GHz; whilst on ion-etched patterned resonant linesR s (77K, 10GHz) it is about 10mΩ.

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Sparvieri, N., Fiorello, A.M., Marescialli, L. et al. Microwave characterization of YBa2Cu3O7−x thin films grownin situ by Off-axis magnetron sputtering. Nouv Cim D 16, 2005–2010 (1994). https://doi.org/10.1007/BF02471859

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  • DOI: https://doi.org/10.1007/BF02471859

PACS 74.75

PACS 84.30.Ey

PACS 01.30.Cc

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