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Structural and morphological properties of ultrathin YBCO films grown on single-crystal substrates

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Il Nuovo Cimento D

Summary

Epitaxial (001)-oriented ultrathin YBCO films of different thicknesses are deposited by Inverted Cylindrical Magnetron Sputtering (ICMS) on (100) MgO single-crystal substrates. The mean films stoichiometry is determined by Rutherford Backscattering (RBS). Auger Electron Spectroscopy (AES), X-ray Photoemission Spectroscopy (XPS) and Scanning Electron Microscopy (SEM) are employed in order to analyse film growth, and identify spurious phases present in the samples.

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Author notes

  1. M. Valentino

    Present address: Ansaldo CRIS, Napoli, (Italy)

Authors and Affiliations

  1. Dipartimento di Scienze Fisiche dell'Università Federico II, Napoli, Italy

    F. Miletto Granozio, E. Perillo, U. Scotti di Uccio, G. Spadaccini & M. Valentino

  2. Dipartimento di Scienze Chimiche dell'Università, Catania, Italy

    G. G. Condorelli, I. L. Fragala & G. Malandrino

Authors
  1. F. Miletto Granozio
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  2. E. Perillo
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  3. U. Scotti di Uccio
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  4. G. Spadaccini
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  5. M. Valentino
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  6. G. G. Condorelli
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  7. I. L. Fragala
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  8. G. Malandrino
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Granozio, F.M., Perillo, E., di Uccio, U.S. et al. Structural and morphological properties of ultrathin YBCO films grown on single-crystal substrates. Nouv Cim D 16, 2031–2038 (1994). https://doi.org/10.1007/BF02471863

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  • DOI: https://doi.org/10.1007/BF02471863

PACS 74.75

PACS 01.30.Cc

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