Abstract
We have demonstrated experimentally the coupling between two thin-film waveguides with a sputter-etched grating as the phase-matching element. A maximum coupling efficiency of only 27% has been measured. Using the weak interaction perturbation analysis, we have found that the loss due to the scattering into the substrate modes is a dominator factor responsible for the measured low efficiency.
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Hsu, H.P., Chang, W.S.C. The efficiency of grating coupling of two thin-film waveguides. Opt Quant Electron 7, 459–464 (1975). https://doi.org/10.1007/BF00619323
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DOI: https://doi.org/10.1007/BF00619323