Abstract
The crystal structure and transport properties of epitaxial c-oriented YBa2Cu3O7−x films are investigated for high-T c layer thicknesses from 5 to 300 nm. The films were prepared by laser deposition. Films less than 30 nm thick become predominantly single-domain in the direction of the c axis. As the thickness decreases, the orthorhombicity parameter of the YBaCuO lattice decreases, which correlates with the critical temperature degradation observed in films less than 9 nm thick. The obtained thickness dependence of the effective microwave surface resistance of a YBaCuO film agrees well with the computational result obtained in the framework of local electrodynamics for samples with a constant microwave conductance.
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Pis’ma Zh. Éksp. Teor. Fiz. 63, No. 8, 608–613 (25 April 1996)
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Varganov, A.V., Vopilkin, E.A., Vysheslavtsev, P.P. et al. Structure and transport properties of ultrathin YBa2Cu3O7−x films. Jetp Lett. 63, 644–650 (1996). https://doi.org/10.1134/1.567081
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DOI: https://doi.org/10.1134/1.567081