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Resolution enhancement in three-dimensional confocal microscopy

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Abstract

We discuss various methods of tuning and improving both the optical sectioning strength and the lateral resolution of the confocal scanning optical microscope. Techniques based on using different wavelengths, pupil plane filters, different sized detectors and laterally displaced detectors are considered and experimental results presented. Both bright field reflection and fluorescence imaging are discussed.

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Authors and Affiliations

  1. Department of Engineering Science, University of Oxford, Parks Road, OX1 3PJ, Oxford, England

    S. J. Hewlett & T. Wilson

Authors
  1. S. J. Hewlett
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  2. T. Wilson
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Hewlett, S.J., Wilson, T. Resolution enhancement in three-dimensional confocal microscopy. Machine Vis. Apps. 4, 233–242 (1991). https://doi.org/10.1007/BF01815300

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  • DOI: https://doi.org/10.1007/BF01815300

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