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Trace analysis of high-purity iron by total reflection X-ray fluorescence spectrometry

  • Original Papers
  • Metal Trace Analyses
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Fresenius' Journal of Analytical Chemistry Aims and scope Submit manuscript

Summary

A combined procedure enabling simultaneous multielement analysis of trace impurities in high-purity iron is presented. After removal of the iron matrix by solvent extraction with methyl isobutyl ketone, the trace elements Ti, V, Cr, Mn, Ni, Cu, Pb and Bi are determined by means of total reflection X-ray fluorescence analysis. Detection limits are found in the range of 100 ng/g. The reliability of the method is verified by the analysis of commercial high-purity iron and by the comparison of analytical data obtained by ICP-AES.

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Author notes

  1. J. S. Chen

    Present address: Materials Research Laboratories, ITRI, 31015, Hsinchu, Chutung, Taiwan, ROC

Authors and Affiliations

  1. Institut für Spektrochemie und angewandte Spektroskopie, P.O.B. 101352, W-4600, Dortmund 1, Federal Republic of Germany

    J. S. Chen, H. Berndt, R. Klockenkämper & G. Tölg

  2. Laboratorium für Reinststoffanalytik, Max-Planck-Institut für Metallforschung, Stuttgart, Bunsen-Kirchhoff-Strasse 13, W-4600, Dortmund 1, Federal Republic of Germany

    G. Tölg

Authors
  1. J. S. Chen
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  2. H. Berndt
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  3. R. Klockenkämper
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  4. G. Tölg
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Chen, J.S., Berndt, H., Klockenkämper, R. et al. Trace analysis of high-purity iron by total reflection X-ray fluorescence spectrometry. Fresenius J Anal Chem 338, 891–894 (1990). https://doi.org/10.1007/BF00322026

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  • DOI: https://doi.org/10.1007/BF00322026

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