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Trapping and reflection coefficients for deuterium in graphite at oblique incidence

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Abstract

Trapping and particle reflection coefficients for 0.4–10keVD on graphite have been measured for angles of incidence 0≦α≦85° by determining the areal density of implanted D as a function of the implanted fluence. The experimental data are compared to computer calculations with the TRIM-program. The agreement between measurement and calculation is good.

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Authors and Affiliations

  1. EURATOM Association, Max-Planck-Institut für Plasmaphysik, D-8046, Garching bei München, Germany

    C. K. Chen, B. M. U. Scherzer & W. Eckstein

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  1. C. K. Chen
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  2. B. M. U. Scherzer
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  3. W. Eckstein
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Chen, C.K., Scherzer, B.M.U. & Eckstein, W. Trapping and reflection coefficients for deuterium in graphite at oblique incidence. Appl. Phys. A 33, 265–268 (1984). https://doi.org/10.1007/BF00614669

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  • DOI: https://doi.org/10.1007/BF00614669

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