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Received: 25 July 1997/Accepted: 1 October 1997
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Sasaki, K., Koike, Y., Azehara, H. et al. Lateral force microscope and phase imaging of patterned thiol self-assembled monolayer using chemically modified tips . Appl Phys A 66 (Suppl 1), 1275–1277 (1998). https://doi.org/10.1007/s003390051342
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DOI: https://doi.org/10.1007/s003390051342