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Received: 25 July 1997/Accepted: 1 October 1997
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Reusch, B., Geis-Gerstorfer, J. & Ziegler, C. Scanning probe microscopy on new dental alloys . Appl Phys A 66 (Suppl 1), S805–S808 (1998). https://doi.org/10.1007/s003390051246
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DOI: https://doi.org/10.1007/s003390051246