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J. Appl. Cryst. (1974). 7, 296-297
https://doi.org/10.1107/S0021889874009587
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Evidence of escape peaks caused by a Si(Li) detector in energy-dispersive diffraction spectra

B. Buras, J. S. Olsen, A. L. Andersen, L. Gerward and B. Selsmark
The appearance and identification of silicon Kα escape peaks in energy-dispersive X-ray diffraction spectra are reported.
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