Elsevier

Optical Materials

Volume 1, Issue 2, April 1992, Pages 71-74
Optical Materials

Refractive optical nonlinearities in a thin film ZnSe interference filter

https://doi.org/10.1016/0925-3467(92)90003-6Get rights and content

Abstract

Picosecond angularly-resolved excite-probe measurements have been used to make the first identification of a negative refractive optoelectronic nonlinearity in the ZnSe material deposited in thin-film nonlinear interference filters. A positive thermal refractive nonlinearity becomes dominant within 6 ps. We attribute the ultrafast relaxation of the photoexcited carriers to surface recombination at grain boundaries within the material.

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