Application of a point-charge model to the O2−, O22− and O2− ions formed in the presence of Li, K and Cs
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Cited by (21)
Cs oxide aggregation in SIMS craters in organic samples for optoelectronic application
2012, Surface ScienceCitation Excerpt :Besides, the oxidation of Cs is very complex because of the existence of a series of Cs oxides [1,20]. There are some well-described studies on the oxidation of Cs surface films deposited in high vacuum by Cs getters onto surfaces of Cu [1], Ag [21,22], Ru [15,23], Ni/Pt [24], GaAs [25,26] and InP [3] as well as on alternating Cs-graphite layers [20,27]. The authors were investigating the electronic properties of Cs oxides mainly by ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS).
The effect of surface state on the kinetics of cerium-hydride formation
2007, Journal of Alloys and CompoundsSurface characterisation of cerium layers on galvanised steel
2004, Surface and Coatings Technology
- 1
Present address: CRMD, 1b Rue de la Férollerie, F-45071 Orléans Cedex 2, France.
- 2
Present address: Surface du Verre et Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, France.
Copyright © 1992 Published by Elsevier B.V.