Matrix effects. Thick targetsThe influence of matrix effects on absolute analysis using pixe
References (7)
- et al.
X-rays in atomic and molecular physics
- et al.
Z. Physik
(1974)
There are more references available in the full text version of this article.
Cited by (13)
Uses of PIXE at low proton energies
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1987, Materials Science and EngineeringPIXE analysis of intermediate and thick targets via line intensity ratios
1984, Nuclear Inst. and Methods in Physics Research, BPIXE analysis of thick targets
1984, Nuclear Inst. and Methods in Physics Research, BDependence of X-ray yields on different parameters for light element matrices in thick target PIXE and use of standards for calibration in such analysis
1983, Nuclear Instruments and Methods In Physics Research
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