Part I. Light element profilingDepth profiling of helium concentrations in materials using the 4He(7Li, γ)11B reaction
References (8)
- et al.
J. Nucl. Mat.
(1976) - et al.
Application of ion beams to metals
J. Nucl. Mat.
(1974)- J. P. Biersack and D. Fink, private...
There are more references available in the full text version of this article.
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1980, Nuclear Physics, Section AImplantation Profiles of Low-Energy Helium in Silicon Carbide
1984, Japanese Journal of Applied PhysicsDepth Profiling of Low-Energy Helium in Ni using Gas Desorption
1970, Shinku/Journal of the Vacuum Society of Japan
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