Cross sections as a function of energy for the scattering of protons from 12C
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Cited by (27)
Experimental study of proton scattering on carbon
2011, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsCitation Excerpt :This is higher as this energy lies near the 8.16 MeV-resonance. The measured angular distribution with a least square fit at 8 MeV would provide the excitation functions for angles in the backward direction in the 7.6–8 MeV energy range where these are essentially constant [4]. The data could be used for carbon depth profile measurements using the coincidence between the in-elastically scattered protons from the 4.43 MeV level and the corresponding emitted gamma rays.
Proton elastic scattering differential cross-sections for <sup>12</sup>C
2011, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsCitation Excerpt :The differential cross-section values obtained in the present study for the 12C(p,p0)12C reaction are presented, along with the corresponding combined experimental errors (at ±1σ accuracy), in Fig. 2a–d for the detection angles 140°, 150°, 160° and 170° respectively, and Fig. 3 demonstrates the cross-section angular dependence. Data from the present work are plotted in Fig. 2a–d along with data from literature [3–11], for comparison, although above 4.5 MeV very few datasets exist. All the obtained differential cross-section values are also presented – following the usual convention – in Table 1.
A high efficiency, low background detector for measuring pair-decay branches in nuclear decay
2008, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated EquipmentDepth profiling of carbon in silicon using the <sup>12</sup>C(p, p′γ) reaction
2008, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsCitation Excerpt :Using a proton beam with energy of approximately 8 MeV or higher, the carbon concentration in the depth region of more than 20 μm, in case of the silicon substrate, can be analyzed with this method. Quantitative analysis of carbon concentrations is possible, because the cross sections of the 12C(p, p′) reaction have been precisely measured over a wide energy range [6,7]. Utilization of this analytical method is planned for the analysis of SiC formed by ion beam synthesis using carbon ions with energies of several tens of MeV.
Ion beam analysis of carbon using <sup>12</sup>C(p,p′γ) reaction
2004, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsSearch for short-lived axions in a nuclear isoscalar transition
1986, Physics Letters B
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Now at the University of Florida, Gainesville, Florida.
- ††
NASA Fellow in Physics, now at the University of Wisconsin, Madison, Wisconsin.
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Now at the University of Kentucky, Lexington, Kentucky.