A new technique for quantifying light elements in thin samples

https://doi.org/10.1016/0168-583X(90)90224-IGet rights and content

Abstract

In recent years, ion beam analysis of the light elements (Li-Si) in thin samples has gained interest, e.g. in the field of aerosols. A new ion beam analytical coincidence technique for this purpose is presented, using reactions of the type X(p, p'γ) X and X(p, αγ)Y. The technique is based on accurate timing of the interactions of the various nuclear reaction products in the detectors, coupled with an event-by-event acquisition and multi-parameter presentation of the data. Using Monte Carlo simulations, the technique is shown to match the capabilities of other similar ion beam analytical techniques. The concept of the technique is described, and the influence of different physical parameters is studied in Monte Carlo simulations. The main features of the Monte Carlo simulations, especially the suppression of the background, were verified experimentally.

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