A theoretical evaluation of ion induced secondary electron emission☆
References (16)
- et al.
Surface Sci.
(1979)et al.Surface Sci.
(1979) - et al.
Phys. Stat. Sol.
(1984) - et al.
- et al.
Astrophys. J.
(1961) - et al.
Phys. Rev.
(1977) - et al.
Mat. Fys. Medd. Dan. Vid. Selsk
(1980) - et al.
Vakuum Techn.
(1983) - et al.
Phys. Rev.
(1982)
There are more references available in the full text version of this article.
Cited by (12)
A model of secondary electron imaging in the helium ion scanning microscope
2009, UltramicroscopyInfluence of the target thickness on the backward and forward electron emission characteristics induced by protons incident on thin carbon foils
2005, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsCitation Excerpt :For thin metallic or carbon foils, experiments [5] have shown that Rγ is always larger than one for all projectile and target combinations. This is due to the anisotropy of the “source” of excited electrons inside the material, i.e. to the fact that the electrons are preferentially excited in the forward direction [6,7]. In particular, close collisions lead to high energy electrons excited in the forward direction, that can be called δ-electrons [8].
Approximate solution of the Boltzmann electron transport equation in a semi-infinite medium and surface correction to the secondary electron yield
1992, Nuclear Inst. and Methods in Physics Research, BStudy of the influence of the electron capture and loss process on the secondary electron emission induced by protons in aluminium
1992, Nuclear Inst. and Methods in Physics Research, BIon beam current dependence of secondary electron emission from thin carbon foils
1986, Nuclear Inst. and Methods in Physics Research, BIon-induced secondary electron spectra from clean metal surfaces
1986, Nuclear Inst. and Methods in Physics Research, B
Copyright © 1986 Published by Elsevier B.V.