A theoretical evaluation of ion induced secondary electron emission

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Abstract

Theoretical predictions of three electron transport models are compared for H+ induced secondary electron emission from Al. In particular, the secondary electron energy distribution and the ion energy dependence of the secondary electron yield have been obtained. For thin targets, we have calculated the forward and backward electron yields as well as their dependence upon the angle of incidence of the ions. Our results are in agreement with the presently available experimental data. However, further work is needed to describe adequately the thin foil results.

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Cited by (12)

  • Influence of the target thickness on the backward and forward electron emission characteristics induced by protons incident on thin carbon foils

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    Citation Excerpt :

    For thin metallic or carbon foils, experiments [5] have shown that Rγ is always larger than one for all projectile and target combinations. This is due to the anisotropy of the “source” of excited electrons inside the material, i.e. to the fact that the electrons are preferentially excited in the forward direction [6,7]. In particular, close collisions lead to high energy electrons excited in the forward direction, that can be called δ-electrons [8].

  • Ion beam current dependence of secondary electron emission from thin carbon foils

    1986, Nuclear Inst. and Methods in Physics Research, B
  • Ion-induced secondary electron spectra from clean metal surfaces

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Work supported by the IISN.

From the Fods National de la Recherche Scientifique (aspirant).

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