The pn-CCD on-chip electronics

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Abstract

A new pn-CCD with an activa area of 3 × 1 cm2 was recently fabricated for ESA's X-ray Multi Mirror Mission (XMM). The front-end electronics has been integrated on the same chip as the detector, and its noise behaviour was investigated. X-rays from a 55Fe source have been used for the absolute calibration. The measured electronic Equivalent Noise Charge (ENC) of the on-chip amplifier was 8.8 e at room temperature and 2.2 e at the CCD operating temperature of 150 K. The improvements with respect to the last version with noise figures of 4.8 e (at 150 K) are due to the reduction of the total input capacitance by a factor of 1.6, the improvement of the transistor transconductance by a factor of 2, and the reduction of 1ƒ noise because of the different p-well implant with a better thermal annealing.

References (10)

  • L. Strüder

    Nucl. Instr. and Meth.

    (1990)
  • H. Bräuninger
  • E. Gatti et al.

    Nucl. Instr. and Meth.

    (1984)
  • W. Buttler

    Nucl. Instr. and Meth.

    (1990)
  • W. Buttler

    Nucl. Instr. and Meth.

    (1988)
There are more references available in the full text version of this article.

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1

Max-Planck-Institute for Extraterrestrial Physics (MPE).

3

KETEK GmbH.

4

KFA Jülich, D-5140 Jülich, FRG.

2

Max-Planck-Institute for Physics.

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