Enhanced linear polarization for tagged photon beams

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Abstract

The Illinois photon tagging facility has been modified to provide beams with a high degree of linear polarization. The method allows the polarization of an off-axis tagged photon beam to be greatly enhanced by means of a kinematic selection of the post-bremsstrahlung residual electrons that are used for tagging. As an initial test of the system, photon scattering was observed from the strong 1+ levels in magnesium and silicon.

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On leave from II. Physikalisches Institut, Gottingen, Germany.

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