Letter to the editor
Silicon for ultra-low-level detectors and 32Si

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Abstract

A recent dark matter experiment using a silicon diode detector confirms that the decay of 32Si is a dangerous background in ultra-low-level experiments using silicon as detector material or shielding. In this Letter we study the mechanism of how 32Si enters commercially available silicon. Ways to avoid this contamination are pointed out. Limits on the 32Si content of silicon from measurements with miniaturized low-level proportional counters are also given.

References (18)

  • D.E. Alburger et al.

    Earth Planet. Sci. Lett.

    (1986)
  • R. Kater et al.

    Isotopenpraxis

    (1975)
  • F.T. Mackenzie et al.

    Science

    (1971)
  • V.N. Nijampurkar et al.

    Nature

    (1966)
  • L. Stodolsky
  • B. Sadoulet

    IEEE Trans. Nucl. Sci. NS-35

    (1988)
  • C.J. Martoff

    Science

    (1987)
  • D. Elmore

    Phys. Rev. Lett.

    (1980)
  • H. Kutschera

    Phys. Rev. Lett.

    (1980)
There are more references available in the full text version of this article.

Cited by (4)

  • Naturally occurring <sup>32</sup>Si and low-background silicon dark matter detectors

    2018, Astroparticle Physics
    Citation Excerpt :

    In Ref. [11], e.g., Martoff notes that silicate rock sourced from deep underground should be low in 32Si because it has been isolated from the atmospheric 32Si source for a sufficiently long time. A later review by Plaga acknowledges 32Si as a potential background issue and advises use of silicate rock that has not mixed with ground water as a source material for low-background silicon detectors [12]. Plaga goes on to cite measurements in which water from deep wells showed 32Si activities of 0.04–0.06 decays/(kg d) [13], thereby cautioning that deep underground water may not be entirely free of 32Si; thus it is not certain that underground sources of silicate rock will necessarily be free of 32Si.

  • Low-radioactivity background techniques

    1995, Annual Review of Nuclear and Particle Science
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