Nuclear Instruments and Methods in Physics Research
Volume 222, Issues 1–2, 15 May 1984, Pages 259-261
Use of a semiconductor detector in anomalous (resonance) X-ray scattering measurement of local structure of an amorphous alloy
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Cited by (3)
Structure of quasi-crystalline AlMnRu: X-ray and neutron studies
1988, Materials Science and EngineeringAnomalous Small-Angle X-ray Scattering from a Sulfonated Polystyrene Ionomer
1988, Macromolecules
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Permanent address: Research Institute of Mineral Dressing and Metallurgy (SENKEN), Tohoku University, Sendai 980, Japan.
Copyright © 1984 Published by Elsevier B.V.