Abstract
IONIZING charged particles can leave damage trails in certain dielectric solids which, in suitable conditions, can be chemically etched into visible, usually cone-shaped, tracks1–3. Such tracks have been widely studied in minerals, glasses, and synthetic polymers4, but damage tracks in natural resin solids such as amber have not previously been studied.
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UZGIRIS, E., FLEISCHER, R. Physical Sciences: Charged Particle Track Registration in Amber. Nature 234, 28–30 (1971). https://doi.org/10.1038/234028a0
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DOI: https://doi.org/10.1038/234028a0
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