Title:
Sampling, wavelets, and tomography /
Contributer:
Benedetto, John
,
Zayed, Ahmed I.
Publisher:
Boston :Birkhäuser,
Year of publication:
2003
Pages:
p. cm
Series Statement:
Applied and computational harmonic analysis
ISBN:
0-8176-4304-4
,
3-7643-4304-4
Type of Medium:
Book
Language:
English
Keywords:
Hamonic analysis
;
Wavelets (Mathematics)
;
Fourier analysis
;
Sampling (Statistics)
;
Tomography
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