ZIB

1

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A measurement of τ polarization in Z^0 decays (1992-8977)

L3 Collaboration

Amsterdam : Elsevier

Physics Letters B 294 (1992), S. 466-478

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ISSN: 0370-2693

Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002

Topics: Physics

Type of Medium: Electronic Resource

URL: http://linkinghub.elsevier.com/retrieve/pii/0370-2693(92)91549-O

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2

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Measurement of the average lifetime of b hadrons (1993-4325)

L3 Collaboration

Amsterdam : Elsevier

Physics Letters B 317 (1993), S. 474-484

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ISSN: 0370-2693

Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002

Topics: Physics

Type of Medium: Electronic Resource

URL: http://linkinghub.elsevier.com/retrieve/pii/0370-2693(93)91027-K

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3

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An Exploration on the Bridge Formation Mechanism of Cylindrical Storage Poly-Silicon by Water Marks in High Performance 4Gigabit DRAM Capacitor (2001)

Lee, Kun Tack ; Shim , Woo Gwan ; Ko, Hyung Ho ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 15-18

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.15.pdf

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4

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New Aqueous Clean for Aluminum Interconnects: Part I. Fundamentals (2001)

Rath, D.L. ; Ravikumar, R. ; Delehanty, D.J. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 31-34

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.31.pdf

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5

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Modification of Low-K SiCOH Film Porosity by a HF Solution (2001)

Shamiryan, Denis ; Baklanov, Mikhail R. ; Vereecke, Guy ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 135-138

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.135.pdf

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6

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Materials Compatibility and Organic Build-Up during Ozone-Based Cleaning of Semiconductor Devices (2001)

De Smedt, F. ; De Gendt, Stefan ; Heyns, Marc M. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 63-66

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.63.pdf

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7

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Preparation and Characterization of Time Dependent Haze on Silicon Surfaces (2001)

Münter, N. ; Kolbesen, Bernd O. ; Storm, W. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 115-118

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.115.pdf

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8

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Gap States at the Interface of Ultra-Thin Oxide and Organic Films on Si(100) (2001)

Bitzer, T. ; Rada, T. ; Richardson, N.V. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 131-134

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.131.pdf

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9

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Influence of Boron and Fluorine Incorporation on the Network Structure of Ultrathin SiO〈sub〉2〈/sub〉 (2001)

Miyazaki, Seiichi ; Morino, Kazuhiro ; Hirose, Masataka

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 149-152

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.149.pdf

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10

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Effect of Chemical Oxides Formed During Pre-Gate Oxide Cleaning on the Properties of Sub 20Ǻ Thick Ultra-Thin Stack Gate Dielectrics (2001)

Jeon, Joong S. ; Ogle, Bob

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 165-168

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.165.pdf

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11

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Effect of Surface Charge and Fluid Properties on Particle Removal Characteristics of a Surface-Optimized REB Filter (2001)

Kelly, Wayne P. ; Grant, Donald C. ; Zahka, Joseph ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 271-274

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.271.pdf

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12

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Application of Megasonic Single Wafer Cleaning Technology to LSI Mass Production Line (2001)

Shimada, Yutaka ; Itou, Hiroshi ; Ishii, Y. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 241-244

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.241.pdf

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13

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Cathodoluminescence Study of the Y〈sub〉0〈/sub〉 Emission from ZnSe Films (2001)

Mita, T. ; Yamamoto, N. ; Mitsui, T. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 89-94

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.89.pdf

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14

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Low Consumption Front End of the Line Cleaning: LC-FEOL (2001)

Besson, Pascal ; Cowache, C. ; Fabbri, J.M. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 199-202

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.199.pdf

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15

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Particle Removal Mechanism of Hydrogenated Ultrapure Water with Megasonic Irradiation (2001)

Morita, Hiroshi ; Ida, Jun ichi ; Ota, Osamu ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 245-250

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.245.pdf

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16

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Single Contact Beam Induced Current Phenomena - A Review (2001)

Chan, Daniel S.H. ; Phang, Jacob C.H. ; Chin, J.M. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 11-18

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.11.pdf

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17

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LBIC Control Mapping of Textured Silicon Thin Film Obtained by Liquid Phase Epitaxy on Transferable Silicon Grid (2001)

Fave, A. ; Boyeaux, J.P. ; Lemiti, Mustapha ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 49-56

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.49.pdf

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18

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Impurity Concentration Mapping in Mulitcrystalline Silicon Wafers (2001)

Martinuzzi, Santo ; Palais, Olivier

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 3-10

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.3.pdf

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19

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Wet Cleaning of Trenches and Vias after Oxide/Nitride Dry Etch with Cu Exposed (2001)

Verhaverbeke, Steven ; Shao, Jason Chi-Hao ; Liu, Lewis

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 311-0

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.76-77.311.pdf

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20

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SEM CL In-Situ Observation during Dislocation Motion in GaAs and CdTe (2001)

Hoering, L. ; Schreiber, Jürgen ; Hilpert, U.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 139-148

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.139.pdf

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21

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Defect Characteristics in Sulfur-Implanted CVD Homoepitaxial Diamond (2001)

Hasegawa, Mitsuru ; Ogura, M. ; Takeuchi, Daisuke ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 171-176

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.171.pdf

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22

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Defects Analysis of Diamond Films in Cross Section Using Cathodoluminescence and High-Resolution Transmission Electron Microscopy (2001)

Takeuchi, Daisuke ; Watanabe, Hideyuki ; Yamanaka, Sadanori ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 197-204

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.197.pdf

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23

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Negative Photoconductivity in Polycrystalline Silicon Films Doped with Phosphorus (2001)

Nakabayashi, Masashi ; Ohyama, H. ; Simoen, Eddy ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 225-230

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.225.pdf

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24

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Deep Levels in Bulk-ZnSe Grown by Bridgman Method (2001)

Yoneta, M. ; Kubo, T. ; Ohmori, K. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 367-376

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.367.pdf

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25

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TEM Observation of Barium Titanate Thin Films Consisting of Nano-Sized Single Crystals Prepared by Sol-Gel Processing (2001)

Yamashita, Y. ; Kurata, N. ; Kuwabara, Makoto

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 387-394

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.78-79.387.pdf

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26

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Charge Transport in Polycrystalline Organic Field-Effect Transistors (2001)

Horowitz, Gilles

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 3-14

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.3.pdf

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27

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Large-Area Polycrystalline p-Type Silicon Films Produced by the Hot Wire Technique (2001)

Ferreira, Isabel ; Martins, Rodrigo ; Cabrita, A. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 47-52

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.47.pdf

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Effect of Pressure and Temperature on the Electrical Properties of LPCVD Silicon-Germanium Thin Films (2001)

Guillet, Denis ; Sarret, M. ; Lhermite, H. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 89-94

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.89.pdf

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Nucleation and Growth of Hydrogenated Microcrystalline Silicon Films: New Insights from Scanning Probe Microscopies (2001)

Herion, J. ; Ross, Ch

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 77-82

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.77.pdf

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Hydrogen Penetration into Si under Wet Chemical Etching: Experiment and Simulation (2001)

Feklisova, Olga V. ; Yakimov, E.B. ; Yarykin, Nikolai

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 121-126

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

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URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.121.pdf

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31

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Polysilicon Thin-Film Solar Cells: Influence of the Deposition Rate upon Enhanced Diffusion and on Cell Performance (2001)

Beaucarne, G. ; Caymax, Matty ; Peytier, I. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 269-274

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.269.pdf

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Photosensitive Properties of CuIn〈sub〉x〈/sub〉Ga〈sub〉1-x〈/sub〉Te〈sub〉2〈/sub〉/n-InSe Structures (2001)

Zaretskaya, E.P. ; Gremenok, V.F. ; Rud', Yu. V. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 293-298

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.293.pdf

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Numerical Modeling and Simulation of Output Parameters in Poly-Si Homojunction nip (or pin) Solar Cells (2001)

Zebentout, Baya ; Sehil, H. ; Benamara, Z. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 317-324

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

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Microcrystalline Silicon - Relation between Transport and Microstructure (2001)

Kočka, J. ; Stuchlíková, H. ; Stuchlík, J. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 213-224

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Simulation of the Backward Current in Polycrystalline Silicon Thin-Film Transistors (2001)

Baudet, M. ; Lhermite, H. ; Mohammed-Brahim, T.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 379-384

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Manufacturing of Precise SiC Components by Nd:YAG Laser Radiation (2001)

Kreutz, E.W. ; Weichenhain, R. ; Horn, A. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 441-446

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On the Mechanism of Defect Suppression in Nitrogen-Doped Silicon Single Crystals (2001)

von Ammon, Wilfried ; Hölzl, Robert ; Virbulis, J. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 17-24

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Polycrystalline Silicon Thin-Film Transistors (2001)

Wagner, Sigurd ; Wu, Ming ; Min, Bock-Gi Robert ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 325-336

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Low-Temperature Plasma-Processed Microcrystalline Silicon Thin Films for Large-Area Electronics (2001)

Roca i Cabarrocas, Pere ; Kumar, Surendra ; Tripathi, V. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 361-366

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Addressing of Organic Electroluminescent Displays (2001)

Pribat, Didier ; Plais, F.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 385-390

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Porous Silicon in Microsystems: Thermal Isolation Applications (2001)

Périchon, S. ; Lysenko, Vladimir ; Remaki, B. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 417-428

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Polycrystalline Silicon as a Material for Magnetic Sensors: Application to Hall and TFT-Hall Cells (2001)

Le Bihan, F. ; Carvou, E. ; Rogel, R. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 447-0

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Carbon-Oxygen-Related Complexes in Irradiated and Heat-Treated Silicon: IR Absorption Studies (2001)

Murin, L.I. ; Markevich, V.P. ; Lindström, J. Lennart ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 57-62

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Silicon Isotope Shifts of the 648-cm〈sup〉-1〈/sup〉 Infrared Absorption Line of Oxygen in Silicon (2001)

Yamada-Kaneta, Hiroshi

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 87-92

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Elastic Instability of Strained Spherical Precipitates as a Cause of Oxide Platelets in Silicon (2001)

Voronkov, Vladimir V. ; Falster, Robert J.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 121-126

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Nitrogen Effect on Hydrogen Penetration into Cz Si during Wet Chemical Etching (2001)

Parakhonsky, A.L. ; Yakimov, E.B. ; Yang, De Ren

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 145-149

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Self-Interstitial Kinetics and Transient Phenomena in Si Crystals (2001)

La Magna, Antonino ; Coffa, Salvatore ; Libertino, Sebania ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 171-176

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Room Temperature Point Defect Migration in Crystalline Si (2001)

Libertino, Sebania ; Coffa, Salvatore

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 207-212

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Atomistic Study of Boron Clustering in Silicon (2001)

Alippi, Paola ; Ruggerone, Paolo ; Colombo, Luciano

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 163-170

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Incorporation, Diffusion and Agglomeration of Carbon in Silicon (2001)

Lavéant, P. ; Werner, P. ; Gerth, G. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 189-194

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Electrical Effects of Point Defect Clouds at Dislocations in Silicon, Studied by Deep Level Transient Spectroscopy (2001)

Schröter, Wolfgang ; Kveder, Vitaly V. ; Hedemann, Henrik

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 213-218

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Monitoring of Defects in Thermal Oxides during Electrical Stress (2001)

Caputo, Domenico ; Irrera, Fernanda ; Palma, Fabrizio

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 237-242

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Impact of Compressive Stress on the Formation of Thermal Donors in Heat-Treated Silicon (2001)

Misiuk, Andrzej ; Andreev, Boris A. ; Emtsev, Valentin V. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 259-266

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Gold Gettering by H〈sup〉+〈/sup〉 or He〈sup〉++〈/sup〉 Ion Implantation Induced Cavities and Defects in Cz Silicon Wafers (2001)

Périchaud, Isabelle ; Yakimov, E.B. ; Martinuzzi, Santo ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 297-302

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Influence of Depth in Helium Desorption from Cavities Induced by 〈sup〉3〈/sup〉He Implantation in Silicon (2001)

Delamare, R. ; Ntsoenzok, E. ; Labohm, F. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 303-308

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Efficiency of Intrinsic Gettering for Copper in Silicon (2001)

Isomae, Seiichi ; Ishida, Hidetsugu ; Itoga, Toshihiko ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 349-354

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The Realization of Uniform and Reliable Intrinsic Gettering in 200mm p- and p/p- Wafers for a Low Thermal Budget 0.18μm Advanced CMOS Logic Process (2001)

Binns, M.J. ; Banerjee, A. ; Wise, R. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 387-392

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Platinum Silicide Precipitate Formation During Phosphorus Diffusion Gettering in Silicon (2001)

Seibt, Michael ; Döller, A. ; Kveder, Vitaly V. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 411-416

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Study of the Effect of Carrier Cross-Sections, on the Leakage Current of Irradiated Silicon Detectors, using the Exchange Charge Model (2001)

Saramad, S. ; Moussavi-Zarandi, A.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 459-464

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Existence of an Epitaxially Ordered Phase in the Buried Oxide of SIMOX Wafers (2001)

Shimura, Takayoshi ; Hosoi, Takuji ; Fukuda, Kazunori ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 485-490

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Proton Irradiation Effects on Standard and Oxygenated Silicon Diodes (2001)

Bisello, D. ; Bacchetta, N. ; Candelori, A. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 477-484

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Nanocrystal MOS with Silicon-Rich Oxide (2001)

Crupi, I. ; Lombardo, Salvatore ; Gerardi, C. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 675-680

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Influence of Ge Content on Electrical Properties: Sheet Resistance and Hall Mobility in Ion Beam Synthesized Si〈sub〉1-x〈/sub〉Ge〈sub〉x〈/sub〉 Alloy (2001)

Cerrina, C. ; Nejim, A. ; Wang, Y. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 557-564

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Electroluminescence of Si Quantum Dots in MOS Structures (2001)

Irrera, A. ; Franzò, G. ; Iacona, F. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 601-606

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Defect Engineering in the Technology of Light-Emitting Structures Based on Monocrystalline Si Implanted with Rare Earth Ions (2001)

Sobolev, N.A.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 645-650

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Nucleation of Nanostructures from Surface Defects on Silicon (2001)

Palermo, V. ; Jones, D.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 687-694

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Oxygen Annealing Behavior in Multicrystalline Silicon (2001)

Yang, De Ren ; Möller, Hans Joachim

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 707-712

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Gate-Oxide Integrity Evaluation Using Non-Ideal Metal-Oxide-Silicon Capacitor Structures (2001)

Mchedlidze, Teimuraz

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 735-740

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SEM Vision Periodic Defect Review and Characterization after Inter-Metal Dielectric Deposition (2001)

Ventola, Stefano ; Fort, Julien ; La Spada, Francesco ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 759-764

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Structure and Stability of Thin Praseodymium Oxide Layers on Si(001) (2001)

Müssig, Hans Joachim ; Dąbrowski, Jaroslaw ; Ignatovich, K. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 783-788

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Minority Carrier Diffusion Lengths in Silicon Doped Gallium Nitride Thin Films Measured by Electron Beam Induced Current (2001)

Grazzi, C. ; Albrecht, M. ; Strunk, Horst P. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 82-84 (Nov. 2001), p. 807-0

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Wettability Modification of Polysilicon for Stiction Reduction in Silicon Based Micro-electromechanical Structures (2001)

Almanza-Workman, Angeles Marcia ; Raghavan, Srini ; Deymier, Pierre ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 23-26

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Synchronous Schlieren Image Analysis of Megasonic Single Wafer Cleaning (2001)

Azuma, Takashi ; Tomozawa, Akihiro ; Kinoshita, Hideo ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 55-58

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The Effect of Ion Implantation on the Metal Contamination of Silicon Surfaces in Aqueous Solution (2001)

Loewenstein, Lee M. ; Mertens, Paul W. ; Heyns, Marc M.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 7-8

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Influence of Cleaning on the Quality of the Bonding Interface in Direct Bonded Silicon Wafers (2001)

Nevin, W.A. ; Gay, D.L. ; O'Neill, G.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 173-176

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Barium, Strontium and Bismuth Contamination in CMOS Processes (2001)

Boubekeur, H. ; Mikolajick, T. ; Höpfner, J. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 9-14

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Chemical Processing and Materials Compatibility of High-K Dielectric Materials for Advanced Gate Stacks (2001)

Guan, J.J. ; Gale, Glenn W. ; Bersuker, G. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 19-22

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Megasonic Silicon Wafer Cleaning and Its Influence on LSI Devices (2001)

Tomozawa, Akihiro ; Ohnishi, Akihiro ; Kinoshita, Hideo ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 235-240

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Novel Back Side Processes for Copper and Pre-Lithography Cleans (2001)

Aegerter, Brian ; Lagrange, Sebastien ; Dundas, Curt ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 89-92

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Pre-Diffusion Cleaning Using Ozone and HF (2001)

Bergman, Eric J. ; Lagrange, Sebastien ; Claes, Martine ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 85-88

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Post SiN Etching Cleaning During Copper and Low K Integration (2001)

Beverina, Alessio ; Louis, Didier ; Arvet, C. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 101-104

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Detection and Identification of Organic Contamination on Silicon Substrates (2001)

Roche, A. ; Marthon, S. ; Ple, J.F. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 111-114

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The Origins of Fluorine in Dry Ultrathin Silicon Oxides (2001)

Vereecke, Guy ; Röhr, Erika ; Carter, R.J. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 153-156

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Controlling Silicon Surface Roughness During Photochemical Cleaning (2001)

Butterbaugh, Jeffery W. ; Schwab, Brent ; Sorsch, Thomas ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 169-172

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Silicon Surface Cleaning after Spacer Dry Etching (2001)

Shamiryan, Denis ; Baklanov, Mikhail R. ; Vanhaelemeersch, Serge

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 303-306

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Pattern Dependent Corrosion Effects in HF Based Post Cu CMP Cleanings (2001)

Fyen, Wim ; Teerlinck, I. ; Lagrange, Sebastien ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 275-278

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Post Copper CMP: a Two Steps Cleaning Recipe (2001)

Beverina, Alessio ; Fabbri, J.M. ; Lévy, Didier ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 76-77 (Jan. 2001), p. 299-302

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Luminescence Centers Characterization in A〈sup〉2〈/sup〉B〈sup〉6〈/sup〉 Semiconductors and Their Thin Diffusion Layers by Cathodoluminescence Defectoscopy (2001)

Nazarov, M.V.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 127-132

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Multi-Band Cathodoluminescence Microscopy for Materials Science (2001)

Saijo, Hiroshi ; Isshiki, Toshiyuki ; Shiojiri, Makoto

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 133-138

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Defect Characterization in Multicrystalline Silicon Using Scanning Techniques (2001)

Ostapenko, Sergei S. ; Tarasov, I. ; Kalejs, Juris P.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 259-266

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Rapid Diffusion of Titanium along Grain Boundaries in Polysilicon during Electron Beam Evaporation (2001)

Yokota, Katsuhiro ; Kobayashi, Takamasa ; Nakamura, Kazuhiro

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 281-288

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Interaction of Copper and Sulfur with Dislocations in GaAs (2001)

Engler, N. ; Leipner, H.S. ; Scholz, R.F. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 331-340

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Development of an Ultra-Precision Positioner and its Applications (2001)

Egashira, Yoshiya ; Kosaka, Kouji ; Takada, Shinji ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 413-418

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Photoabsorption Spectroscopy on Nanometer Scale by Scanning Tunneling Microscopy (2001)

Hida, A. ; Mera, Y. ; Maeda, Koji

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 419-424

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Scanning Capacitance Microscopy on Semiconductor Materials (2001)

Raineri, Vito ; Giannazzo, Filippo

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 78-79 (Apr. 2001), p. 425-0

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Local Potential at Atomically Abrupt Oxide Grain Boundaries by Scanning Probe Microscopy (2001)

Bonnell, Dawn A. ; Kalinin, Sergei V.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 33-46

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Quasi-Epitaxial Growth of Silicon Layers by Hydrogen Reactive Magnetron Sputtering at Temperatures as Low as 200 °C (2001)

Leconte, Y. ; Rizk, Richard ; Gourbilleau, F. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 65-70

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Intra-Grain Defects - Limiting Factor for Low-Temperature Polycrystalline Silicon Films? (2001)

Wagner, Thomas A. ; Oberbeck, L. ; Bergmann, R.B. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 95-100

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ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.95.pdf

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Point Defects in Carbon-Rich Polycrystalline Silicon (2001)

Pivac, B. ; Kovačević, Igor ; Borjanović, V.

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 115-120

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Details

ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.115.pdf

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Structural, Optical and Electrical Properties of Natively Textured ZnO Grown by PECVD for Thin-Film Solar Cell Applications (2001)

Löffler, J. ; Groenen, R. ; Sommeling, P.M. ; [et al.]

s.l. ; Stafa-Zurich, Switzerland

Solid state phenomena Vol. 80-81 (Nov. 2001), p. 145-150

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Details

ISSN: 1662-9779

Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008

Topics: Physics

Type of Medium: Electronic Resource

URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/26/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.80-81.145.pdf

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