ISSN:
0951-4198
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
We have measured the sputtering yields of ammonium chloride and of frozen glycerol films under 8 keV Ar+· bombardment using a thin film depth profiling technique. The sputtering yield of ammonium chloride was 34±3 molecules (NH4Cl)/ion; for frozen glycerol the sputter yield was 54±9 molecules/ion. The results constrain possible mechanisms of damage suppression in organic secondary ion mass spectrometry.
Additional Material:
1 Tab.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/rcm.1290020404