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Massive cluster ablation as preparation for organic secondary ion imaging (1995)

Dookeran, N. N. ; McMahon, J. M. ; Short, R. T. ; [et al.]

New York, NY : Wiley-Blackwell

Rapid Communications in Mass Spectrometry 9 (1995), S. 1321-1324

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ISSN: 0951-4198

Keywords: Chemistry ; Analytical Chemistry and Spectroscopy

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Physics

Notes: A focused Cs+ beam was used to obtain secondary ion mass spectra and images from samples of stearic acid on gold before and after ablation by a beam of masive cluster ions. Ablation appears to have two effects on secondary ion emission. First, the number and intensity of peaks reflecting contamination are substantially reduced. Secondly, the absolute intensity of secondary ion current characteristic of the analyte increases. These features simplify mass spectra and improve contrast in the images obtained.

Additional Material: 4 Ill.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1002/rcm.1290091319

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