Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
2 (1973), S. 143-144
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The Denver X-ray Conferences are known to X-ray analysts all over the world and the August meetings are looked forward to with cosiderable entusiasm by the conference regulars. Even those who have never been fortunate enough to attend one of the meetings are able to follow the presentations by means of the excellent conference books Advances in X-ray Analysis which appear in the Spring following the meeting. The following contribution has been prepared by Professor Newkirk of the University of Denver, who has been active for a number of years on the local Denver Conference committee. Professor Newkirk gives a short history of the conferences and includes some interesting insights into the technical and doemstic arrangements.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300020310
Library |
Location |
Call Number |
Volume/Issue/Year |
Availability |