ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A Comprehensive study of the interfacing of an X-ray energy dispersive spectrometer to a transmission electron microscope is presented. Optimum detector location, sample tilt, collimation and accelerating voltage are discussed. Quantitative elemental analysis is obtained for thin film specimens using corrections for spectrometer response, absorption and background. Peak spectra are sorted using a method of profile fitting based on nonlinear simplex minimization. Using a simple analysis scheme, the peak data is reduced to elemental composition with an accuracy and precision on the order of 1%. Examples from Fe-Ni and Ho-Co alloys are given.
Additional Material:
7 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300040410
